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Year 2020
Category International Journals
CV linkage Yes
Selected Yes
Author M.-S. Yun, W.-J. Nam, and S.-W. Lee
Title Coarse-to-Fine Deep Metric Learning for Remote Sensing Image Retrieval
Journal Name Remote Sensing
Other Vol. 12, No. 2, 2020, doi:10.3390/rs12020219.
File  remotesensing-12-00219-v3+(1).pdf (26.1M) [199] DATE : 2020-02-03 13:46:43
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