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Publications
| Year | 2006 |
|---|---|
| Category | International Journals |
| CV linkage | Yes |
| Selected | Yes |
| Author | S.-W. Lee, H.-C Jung, B.-W. Hwang and S.-W. Lee |
| Title | Authenticating Corrupted Photo Images Based on Noise Parameter Estimation | Journal Name | Pattern Recognition |
| Other | Vol. 39, No. 5, 2006, pp. 910-920. |
| File |  06_01.pdf (652.2K) [1375] DATE : 2015-03-19 09:59:58 |
Pattern Recognition & Machine Learning Lab, Korea University, 145, Anam-ro, Seongbuk-gu, Seoul, 02841, Korea Tel: + 82-2-3290-3572, Fax: +82-2-926-2168