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Publications
Year | 2020 |
---|---|
Category | International Journals |
CV linkage | Yes |
Selected | Yes |
Author | M.-S. Yun, W.-J. Nam, and S.-W. Lee |
Title | Coarse-to-Fine Deep Metric Learning for Remote Sensing Image Retrieval | Journal Name | Remote Sensing |
Other | Vol. 12, No. 2, 2020, doi:10.3390/rs12020219. |
File | remotesensing-12-00219-v3+(1).pdf (26.1M) [1118] DATE : 2020-02-03 13:46:43 |