> PUBLICATIONS > Publications
Publications
| Year | 1995 |
|---|---|
| Category | International Journals |
| CV linkage | Yes |
| Selected | Yes |
| Author | S.-W. Lee and Y.-J. Kim |
| Title | Direct Extraction of Topographic Features for Gray Scale Character Recognition | Journal Name | IEEE Trans. on Pattern Analysis and Machine Intelligence |
| Other | Vol. 17, No. 7, 1995, pp. 724-729. |
Pattern Recognition & Machine Learning Lab, Korea University, 145, Anam-ro, Seongbuk-gu, Seoul, 02841, Korea Tel: + 82-2-3290-3572, Fax: +82-2-926-2168